Radiation damage problems in electron microscopy

نویسنده

  • A. Howie
چکیده

2014 A brief outline is given of the processes of knock-on damage and electronic damage in electron microscopy together with estimates of the damage probabilities. Of the various remedial techniques under investigation, that of low temperature observation seems generally the most promising. Attention is drawn to some of the outstanding problems particularly concerning the nature and behaviour of electronic excitations in molecular crystals and their role in the damage mechanism. Revue Phys. Appl. 15 (1980) 291-295 FÉVRIER 1980, PAGE

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تاریخ انتشار 2016